Layered and surface reference materials

ERM^®-EG001 certificate, report, (BAM-L001/IRMM-302), Antimony implanted in silicon
BAM-L200 certificate, report, Nanoscale stripe pattern for testing of lateral resolution and calibration of length scale
BAM-L100 certificate, report, Titanium (Ti) aluminium (Al) multilayer on 100Cr6 steel substrate
BAM-L101 certificate, report, Titaniumdioxide (TiO₂) siliziumdioxide (SiO₂) multilayer on BK7 glass
BAM-L102 certificate, report, Titaniumnitride (TiN) single layer
BAM-L103 certificate, report, Vanadiumnitride (VN) single layer
BAM-L104 certificate, report, Titaniumcarbide (TiC) single layer
BAM-L105 certificate, report, Vanadiumcarbide (VC) single layer

EDS-TM001 info sheet, Test material for the performance check of an X-ray spectrometer attached to a SEM
EDS-TM001 with software info sheet, Test material and software for the performance check of an X-ray spectrometer attached to a SEM

RM certificates and reports | reference materials | price list

2012-02-07

Contact:

Antimony implanted in silicon

Dr. rer. nat.
Uwe Reinholz
Richard-Willstätter-Straße 11
12489 Berlin
phone:
+49 30 8104-4110
email:
Uwe.Reinholz@bam.de

Ti/Al multilayers TiO2 / SiO2 multilayers TiN, VN, TiC, VC single layers

Dr. rer. nat.
Uwe Beck
Unter den Eichen 44-46
12203 Berlin
phone:
+49 30 8104-1821
email:
Uwe.Beck@bam.de

Nanoscale strip pattern for length calibration and testing of lateral resolution

Dr. Mathias Senoner
Unter den Eichen 44-46
12203 Berlin
phone:
+49 30 8104-3564
email:
mathias.senoner@bam.de

Test material for the performance check of an X-ray spectrometer attached to a SEM

Dr. Vasile-Dan Hodoroaba
Unter den Eichen 44-46
12203 Berlin
phone:
+49 30 8104-3144
email:
dan.hodoroaba@bam.de